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August
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8000Xse
Nanometrics 8000Xse Ox film thickness measurement
Description
Maker
Nanometrics
MODEL
8000X se
Content
Ox film thickness measurement
Condition: Used, AS-IS.
Wafer size: 200 mm.
設備銷售
設備銷售
August
3Di-8000
NSX-95
NSX-105
ASM
MS896A
WS896
CTI
On Board 8F
On Board 10F
Disco
DAD321
DNS
RF3S
SK-2000
WS-820L
Ebara
Frex300
Edwards
iH-1000
EO Tech
CSM 3000
EVG
820
HSEB Zeiss
Axiotron 300
IPEC
472
KLA
Alpha Step D-500
LAM
Ontrak DSS-200
Ontrak Synergy
MKS
OZONE GENERATOR;AX8407B
Nanometrics
8000Xse
EFEM module of Caliper Mosaic
Nanospec 9100
Nikon
ECLIPSE L150
NWL860-TBM with Optophot 200
optiphot 150
Nitto Denko
MA 3000 II
Olympus
AL110-LMB6 with MX51
AL110-LMB86 with MX61
Raytex
RXW-0826SFIX-SMIF
Rorze
Wafer sorter with RR717L1521 robot
Rudolph
MP200XCU
MP300
MP300 XCu
SAMCO
PD3800 PECVD
RIE-212 ICP
SUSS
ACS-200
其他
CTI
Edwards
MKS